{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,20]],"date-time":"2026-03-20T16:10:48Z","timestamp":1774023048016,"version":"3.50.1"},"reference-count":48,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T00:00:00Z","timestamp":1556668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61873073"],"award-info":[{"award-number":["61873073"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012335","name":"National Defense Basic Scientific Research Program of China","doi-asserted-by":"crossref","award":["JCKY2017212C005"],"award-info":[{"award-number":["JCKY2017212C005"]}],"id":[{"id":"10.13039\/501100012335","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Inf."],"published-print":{"date-parts":[[2019,5]]},"DOI":"10.1109\/tii.2018.2875067","type":"journal-article","created":{"date-parts":[[2018,10,9]],"date-time":"2018-10-09T19:04:28Z","timestamp":1539111868000},"page":"2849-2858","source":"Crossref","is-referenced-by-count":180,"title":["Recent Advances in Key-Performance-Indicator Oriented Prognosis and Diagnosis With a MATLAB Toolbox: DB-KIT"],"prefix":"10.1109","volume":"15","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3918-7039","authenticated-orcid":false,"given":"Yuchen","family":"Jiang","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3802-9269","authenticated-orcid":false,"given":"Shen","family":"Yin","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-7439(99)00045-3"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2005.04.007"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2010.2071415"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2012.11.013"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2311409"},{"key":"ref30","doi-asserted-by":"crossref","first-page":"2262","DOI":"10.1109\/TNN.2011.2165853","article-title":"Quality relevant data-driven modeling and monitoring of multivariate dynamic processes: The dynamic T-PLS approach","volume":"22","author":"li","year":"2011","journal-title":"IEEE Trans Neural Netw"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1002\/(SICI)1099-128X(199801\/02)12:1<41::AID-CEM500>3.0.CO;2-F"},{"key":"ref36","article-title":"Properties of partial least squares (PLS) regression, and differences between algorithms","author":"wise","year":"0"},{"key":"ref35","doi-asserted-by":"crossref","first-page":"1436","DOI":"10.1016\/j.isatra.2013.12.022","article-title":"A data-driven multiplicative fault diagnosis approach for automation processes","volume":"53","author":"hao","year":"2014","journal-title":"ISA Trans"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2520906"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2014.2341934"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-7439(98)00109-9"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2364561"},{"key":"ref12","first-page":"7149","article-title":"Comparison of KPI related fault detection algorithms using a newly developed MATLAB toolbox: DB-KIT","author":"jiang","year":"2016","journal-title":"Proc 42nd Annu Conf IEEE Ind Electron Soc"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2006.873524"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2018.2818538"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2013.2253231"},{"key":"ref16","article-title":"Data-driven design of fault diagnosis systems","author":"yin","year":"2012"},{"key":"ref17","doi-asserted-by":"crossref","first-page":"275","DOI":"10.1016\/j.isatra.2016.10.015","article-title":"A nonlinear quality-related fault detection approach based on modified kernel partial least squares","volume":"66","author":"jiao","year":"2017","journal-title":"ISA Trans"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1021\/ie901939n"},{"key":"ref19","first-page":"168","article-title":"Total projection to latent structures for process monitoring","volume":"56","author":"zhou","year":"2010","journal-title":"Process Syst Eng"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2012.2214394"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2516973"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2012.2214394"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2043037"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2752709"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2633989"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2527621"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2018.05.007"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2417501"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"371","DOI":"10.1109\/TII.2010.2103401","article-title":"Robust data-driven modeling approach for real-time final product quality prediction in batch process operation","volume":"7","author":"david","year":"2011","journal-title":"IEEE Trans Ind Informat"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2167110"},{"key":"ref1","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4471-6410-4","author":"ding","year":"2014","journal-title":"Data-driven Design of Fault Diagnosis and Fault-tolerant Control Systems"},{"key":"ref46","first-page":"1995","article-title":"D34MB&#x2013;a FDI toolbox with new features","author":"he","year":"2016","journal-title":"Proc Chinese Autom Congress"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1155\/2013\/707953"},{"key":"ref45","first-page":"3013","article-title":"A fault detection toolbox for MATLAB","author":"varga","year":"2006","journal-title":"Proc IEEE Int Symp Intell Control"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2017.8217242"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2013.10.017"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2006.03.006"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1002\/aic.13959"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1162\/089976605774320557"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1080\/00207721.2014.886136"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1155\/2014\/304754"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2512221"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1016\/S0952-1976(00)00068-3"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2014.2385670"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1016\/S1474-6670(17)42430-X"},{"key":"ref25","first-page":"398","article-title":"Quality-related fault detection approach based on orthogonal signal correction and modified PLS","volume":"11","author":"wang","year":"0","journal-title":"IEEE Trans Ind Informat"}],"container-title":["IEEE Transactions on Industrial Informatics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9424\/8705698\/08486739.pdf?arnumber=8486739","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T20:54:03Z","timestamp":1657745643000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8486739\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,5]]},"references-count":48,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tii.2018.2875067","relation":{},"ISSN":["1551-3203","1941-0050"],"issn-type":[{"value":"1551-3203","type":"print"},{"value":"1941-0050","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,5]]}}}