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© 2008 Springer-Verlag New York
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(2008). Elements of a Transmission Electron Microscope. In: Transmission Electron Microscopy. Springer Series in Optical Sciences, vol 36. Springer, New York, NY. https://doi.org/10.1007/978-0-387-40093-8_4
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DOI: https://doi.org/10.1007/978-0-387-40093-8_4
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Publisher Name: Springer, New York, NY
Print ISBN: 978-0-387-40093-8
Online ISBN: 978-0-387-34758-5
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Keywords
- Scan Transmission Electron Microscopy
- Condenser Lens
- Electron Spectroscopic Imaging
- Thermionic Cathode
- Scan Transmission Electron Microscopy Mode
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
