Physical Insights into the Leakage Mechanisms Governing the Scaling Trends in 4H-SiC Based Junctionless FETs.

Jaspreet Singh Aakash Kumar Jain Mamidala Jagadesh Kumar Physical Insights into the Leakage Mechanisms Governing the Scaling Trends in 4H-SiC Based Junctionless FETs. 344-350 2025 VLSID https://doi.org/10.1109/VLSID64188.2025.00072 conf/vlsid/2025 db/conf/vlsid/vlsid2025.html#SinghJK25