Ralph Oberhuber Christoph Hechtl Klaus Schimpf Berthold Staufer Bandgap yield loss due to dislocations on RFSiGe transceiver ICs: failure analysis, design. 149-150 2004 SoCC https://doi.org/10.1109/SOCC.2004.1362385 conf/socc/2004 db/conf/socc/socc2004.html#OberhuberHSS04