<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<inproceedings key="conf/icmla/SeethiRYLKKA24" mdate="2025-05-31">
<author>Venkata Devesh Reddy Seethi</author>
<author orcid="0000-0003-3290-2474">Ashiqur Rahman</author>
<author>Austin Yunker</author>
<author>Rami Lake</author>
<author>Zachary Kral</author>
<author>Rajkumar Kettimuthu</author>
<author orcid="0000-0002-4733-6586">Hamed Alhoori</author>
<title>Mixture-of-Experts for Multi-Domain Defect Identification in Non-Destructive Inspection.</title>
<pages>1283-1288</pages>
<year>2024</year>
<booktitle>ICMLA</booktitle>
<ee>https://doi.org/10.1109/ICMLA61862.2024.00200</ee>
<crossref>conf/icmla/2024</crossref>
<url>db/conf/icmla/icmla2024.html#SeethiRYLKKA24</url>
<stream>streams/conf/icmla</stream>
</inproceedings>
</dblp>
