{"id":"https://openalex.org/W4254265887","doi":"https://doi.org/10.1109/date.2012.6176679","title":"Large signal simulation of integrated inductors on semi-conducting substrates","display_name":"Large signal simulation of integrated inductors on semi-conducting substrates","publication_year":2012,"publication_date":"2012-03-01","ids":{"openalex":"https://openalex.org/W4254265887","doi":"https://doi.org/10.1109/date.2012.6176679"},"language":"en","primary_location":{"id":"doi:10.1109/date.2012.6176679","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2012.6176679","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5087551675","display_name":"Wim Schoenmaker","orcid":"https://orcid.org/0000-0001-5165-8134"},"institutions":[{"id":"https://openalex.org/I4210140261","display_name":"Magwel (Belgium)","ror":"https://ror.org/03hg1yf12","country_code":"BE","type":"company","lineage":["https://openalex.org/I4210140261"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"W. Schoenmaker","raw_affiliation_strings":["MAGWEL NV, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MAGWEL NV, Leuven, Belgium","institution_ids":["https://openalex.org/I4210140261"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078978096","display_name":"Maxime W Matth\u00e9s","orcid":null},"institutions":[{"id":"https://openalex.org/I180923762","display_name":"University of Cologne","ror":"https://ror.org/00rcxh774","country_code":"DE","type":"education","lineage":["https://openalex.org/I180923762"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"M. Matthes","raw_affiliation_strings":["Mathematical Department Weyertal, University of Cologne, Cologne, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mathematical Department Weyertal, University of Cologne, Cologne, Germany","institution_ids":["https://openalex.org/I180923762"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072395675","display_name":"B. De Smedt","orcid":null},"institutions":[{"id":"https://openalex.org/I4210140261","display_name":"Magwel (Belgium)","ror":"https://ror.org/03hg1yf12","country_code":"BE","type":"company","lineage":["https://openalex.org/I4210140261"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"B. De Smedt","raw_affiliation_strings":["MAGWEL NV, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MAGWEL NV, Leuven, Belgium","institution_ids":["https://openalex.org/I4210140261"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042540626","display_name":"S. Baumanns","orcid":null},"institutions":[{"id":"https://openalex.org/I180923762","display_name":"University of Cologne","ror":"https://ror.org/00rcxh774","country_code":"DE","type":"education","lineage":["https://openalex.org/I180923762"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"S. Baumanns","raw_affiliation_strings":["Mathematical Department Weyertal, University of Cologne, Cologne, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mathematical Department Weyertal, University of Cologne, Cologne, Germany","institution_ids":["https://openalex.org/I180923762"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031340404","display_name":"Caren Tischendorf","orcid":"https://orcid.org/0000-0002-8421-7199"},"institutions":[{"id":"https://openalex.org/I180923762","display_name":"University of Cologne","ror":"https://ror.org/00rcxh774","country_code":"DE","type":"education","lineage":["https://openalex.org/I180923762"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"C. Tischendorf","raw_affiliation_strings":["Mathematical Department Weyertal, University of Cologne, Cologne, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mathematical Department Weyertal, University of Cologne, Cologne, Germany","institution_ids":["https://openalex.org/I180923762"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013539056","display_name":"R. Janssen","orcid":null},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"R. Janssen","raw_affiliation_strings":["High Tech Campus 46, NXP Semiconductors High Tech, Eindhoven, Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"High Tech Campus 46, NXP Semiconductors High Tech, Eindhoven, Netherlands","institution_ids":["https://openalex.org/I109147379"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.6492,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.84833328,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"199","issue":null,"first_page":"1221","last_page":"1226"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.8628532886505127},{"id":"https://openalex.org/keywords/inductor","display_name":"Inductor","score":0.8357148766517639},{"id":"https://openalex.org/keywords/transient-analysis","display_name":"Transient analysis","score":0.6192120313644409},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.555977463722229},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5373318195343018},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5115135908126831},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.4984889030456543},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.47701597213745117},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.3464464843273163},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.267423152923584},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2557634711265564},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1980743110179901},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.08526366949081421}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.8628532886505127},{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.8357148766517639},{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.6192120313644409},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.555977463722229},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5373318195343018},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5115135908126831},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.4984889030456543},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.47701597213745117},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.3464464843273163},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.267423152923584},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2557634711265564},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1980743110179901},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.08526366949081421},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/date.2012.6176679","is_oa":false,"landing_page_url":"https://doi.org/10.1109/date.2012.6176679","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 Design, Automation & Test in Europe Conference & Exhibition (DATE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W66035790","https://openalex.org/W84272617","https://openalex.org/W2086789828","https://openalex.org/W2106994697","https://openalex.org/W2116762615","https://openalex.org/W2117048836","https://openalex.org/W2171283516","https://openalex.org/W2171886636"],"related_works":["https://openalex.org/W2758798772","https://openalex.org/W2001630809","https://openalex.org/W2081338125","https://openalex.org/W4239924455","https://openalex.org/W777979701","https://openalex.org/W2014796125","https://openalex.org/W4244925124","https://openalex.org/W2669128877","https://openalex.org/W1985471711","https://openalex.org/W2377879397"],"abstract_inverted_index":{"We":[0],"present":[1],"a":[2],"formulation":[3],"of":[4,13,41],"transient":[5],"field":[6],"solving":[7],"that":[8],"allows":[9],"for":[10],"the":[11,27,33,38],"inclusion":[12],"semiconducting":[14],"materials":[15],"whose":[16],"dynamic":[17],"responses":[18],"are":[19],"prescribed":[20],"by":[21,31],"drift-diffusion":[22],"modeling.":[23],"The":[24],"robustness":[25],"and":[26],"feasibility":[28],"is":[29],"demonstrated":[30],"applying":[32],"scheme":[34],"to":[35],"compute":[36],"accurately":[37],"large-signal":[39],"response":[40],"an":[42],"integrated":[43],"inductor.":[44]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}